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-% Special thanks to John Jowett and Michel Goossens from CERN and
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%\section{Introduction}
-The Micro-Vertex-Detector (MVD) of the future CBM-experiment will rely on CMOS Monolithic Active Pixel Sensors (MAPS). Those sensors match so-far the requirements of CBM in terms of excellent spatial resolution, ultra-light material budget and non-ionizing radiation tolerance. Intense R\&D is being carried out within a joint research program of the PICSEL group of the IPHC/Strasbourg and the IKF of the Goethe University of Frankfurt/Main in order to improve their tolerance to ionizing radiation and their read-out speed.
+The Micro-Vertex-Detector (MVD) of the future CBM-experiment will rely on CMOS Monolithic Active Pixel Sensors (MAPS). Those sensors match so far the requirements of CBM in terms of excellent spatial resolution, ultra-light material budget and non-ionizing radiation tolerance. Intense R\&D is being carried out within a joint research program of the PICSEL group of the IPHC/Strasbourg and the IKF of the Goethe University of Frankfurt/Main in order to improve their tolerance to ionizing radiation and their read-out speed.
A standard problem during this research is to optimize numerous parameters like diode sizes and the size of transistor gates \cite{Cite:ReportDennis} in order to obtain the best possible detection performance for charged particles, the fastest possible read-out speed and the best possible radiation tolerance.
-As producing MAPS for charged particle tracking is beyond the intended scope of the CMOS-processes, only few reliable simulation tools supporting this optimization are available. Moreover, decisive process parameters were found to be unknown even to the technology providers in the past. To overcome this obstacle and to collect the necessary knowledge, series of process exploration chips are built and tested. Those chips host numerous pixel designs, which vary the (believed to be) relevant sensor parameters in a systematic way. Typical sensors following this strategy were the MIMOSA-32 and MIMOSA-34 sensors, which each provided 32 different kinds of pixels. Moreover, the sensors were manufactured on multiple different wafers to check the dependence of their performances on the wafer properties.
+Producing MAPS for charged particle tracking is beyond the intended scope of the CMOS-processes used. Therefore only few simulation tools, which are suited to assist this optimization, are available. Moreover, decisive process parameters were found to be unknown even to the technology providers in the past. To overcome this obstacle and to collect the necessary knowledge, series of process exploration chips are built and tested. Those chips host numerous pixel designs, which vary the (believed to be) relevant sensor parameters in a systematic way. Typical prototypes following this strategy were the MIMOSA-32 and MIMOSA-34 sensors\cite{Cite:ReportDennis}, which each provided 32 different kinds of pixels. Moreover, the sensors were manufactured on multiple different wafers to check the dependence of their performances on the wafer properties.
-Accounting for the temperature dependence of different effects and the need to evaluate the radiation tolerance of the sensors with multiple data points, in the order of thousand individual measurements are needed to perform a full test of a generation of MAPS. This high number of tests call for a semi-automatic test system, which may run 24/7 with limited human intervention.
+Our measurement protocols foresee to study the temperature dependence of different effects. In addition, we aim to evaluate the radiation tolerance of the sensors with multiple data points. Over all, in the order of thousand individual measurements are needed to perform a full test of a generation of MAPS. This high number of tests call for a semi-automatic test system, which may run 24/7 with limited human intervention.
%MAPS have been proposed as sensor technology for the vertex detectors of the International Linear Collider (ILC), the STAR Heavy Flavor Tracker Upgrade and the Compressed Baryonic Matter (CBM) experiment \cite{Vertex08}. Moreover, they are considered for the upgrade of the ALICE-ITS. The expected integrated radiation doses in these applications range from several $10^{10}~\rm n_{eq}/cm^2$ and few $100~\rm krad$ (ILC) to \mbox{$\gtrsim 10^{13} ~\rm n_{eq}/cm^2$} and $\gtrsim 3~\rm Mrad$ (CBM). Reaching this radiation tolerance is the subject of a .\newline
%The research progress is mainly guided by CMOS features coming available. The non-ionizing radiation hardness could be extended by one order of magnitude by using a high resistivity epitaxial layer \cite{RESMDD2012} and the ionizing radiation hardness by using the 0.18 $\mum$ CMOS process \cite{IWORID}. This was achieved by exploring the technology testing a few tens of different prototype chips. Each chip generation has to be irradiated and characterized. This can result in a comprehensive test program.\newline
%An example is the study of the sensor MIMOSA-34. This chip provides 32 different matrices, that have to be characterized. The measurement of a charge spectrum is limited by the intensity of the available Fe-55-source resulting in a 4h measurement giving a sufficient amount of statistics. This results in a measurement time of 128h per chip and temperature and radiation dose suggesting a permanent operation of the teststand. Due to limited amount of man power, this is only feasible with an automatic measurement system. However, the used teststand was provided by the developers and cannot be modified.\newline
-To build such a system, we complemented the test system received from the PICSEL group of IPHC Strasbourg by an AUTOIT\cite{Cite:AutoIT} based program named MABS\footnote{\textbf{M}imosa \textbf{A}utomated \textbf{B}ot \textbf{S}ystem}. As intended, this software works without modifications of the firmware of the test system but interfaces the GUI of this firmware and executes pre-programmed test protocols by emulating the manual input of a human user. Moreover, it controls and monitors external devices like the cooling system and the temperature sensors of the test system. In case of errors or unexpected events, MABS pushes error messages to the mobile phone of the system operator.
+To build such a system, we complemented the test system received from the PICSEL group of IPHC Strasbourg by an AUTOIT\cite{Cite:AutoIT} based program named MABS\footnote{\textbf{M}imosa \textbf{A}utomated \textbf{B}ot \textbf{S}ystem}. We avoided modifying the firmware of the test system. Instead, MABS interfaces the GUI of this firmware and executes pre-programmed test protocols by emulating the input of a human user. Moreover, it controls and monitors external devices like the cooling system and the temperature sensors of the test system. In case of errors or unexpected events, MABS pushes error messages to the mobile phone of the system operator.
-The data and the run information are stored to a data-base, which can be accessed by the our ROOT-based data analysis software. The human intervention needed for the measurement process is reduced to the necessary to changing of the chip and putting or removing the radiation sources needed for the measurement.
+The data and the run information are stored to a data-base, which can be accessed by our ROOT-based data \mbox{analy}sis software. The human intervention needed for the measurement process is reduced to the necessary exchange of sensors and the installation or removal of the radiation sources needed for testing them.
-MABS was successfully tested and validated during a 24/7 measurement campaign, which lasted for several weeks and demonstrated its capability to obtain more detailed sensors tests with substantially reduced human effort.
+MABS was successfully tested and validated during a 24/7 measurement campaign, which lasted for several weeks, It successfully demonstrated its capability to execute detailed sensor test protocols with only little human intervention.
%It also demonstrates its advantages performing systematic variations, which normally means a permanent manpower operating and monitoring the teststand. MABS allowed e.g. measurements with a small-step variation of the clock frequency requiring only a limited amount of programming effort. \newline
%We hope to improve the system further, so it can be applied to a broader range of future chip generations. Even an automated source change via a step-motor is thinkable.
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